SemiQual provides high quality probe cards for wafer level test.
- Vertical Probe Cards with probe pins
- Cantilever Probe Cards
- P2 Probe Card: NiCrCo, in-line 30um, staged 30um/li>
- P2-b Probe Card: BeCu, Beni, in-line 25um, staged 15um
- High Frequency
- Multi-site Capable
- Needle / blade type
- Fine Pitch 30um – 50um
- Design to Fabrication
